Sunday 23 September 2012

13.00 – 17.00 
Registration Download SPM-P 2012 Scientific program  Download SPM-P 2012 Poster contributions 
13.30 – 18.30              Short Courses  

            13.30 – 14.45  Tutorial 1

Holger Schönherr

University of Siegen, Siegen, Germany

Introduction to Atomic Force Microscopy on Polymers: Forces, Basic AFM Modes and Experimental Aspects


            14.45 – 16.00  Tutorial 2

Philippe Leclère

University of Mons, Mons, Belgium

On the Mapping of the Mechanical Properties of Polymeric Materials at the Nanoscale             by Atomic Force Microscopy


               16.00 – 17.15  Tutorial 3

Peter Schön

University of Twente, Enschede, The Netherlands

Atomic Force Microscopy in Biology: From Single Molecules to Living Cells


17.15 – 18.30  Tutorial 4

Thierry Mélin

University of Lille, Villeneuve d'Ascq, France

An Introduction to Electrostatic Characterization using Scanning Probe Microscopy


19.30 – 21.00              Dinner


21.00 – 22.30              Get Together 


Monday 24 September 2012
07.30 – 17.00 Registration
08.30 – 08.45 Welcome – Opening of the conference
08.45 – 09.45 Keynote Lecture
  Hans-Jürgen Butt
  Max Planck Institute for Polymer Research, Mainz, Germany
  Using Microcantilevers Sensors to Analyse Drop Evaporation and Thin Polymer Films
09.45 – 10.15  Coffee Break
Session 01 : AFM on Biological and Biomimetic Systems I : Biosurfaces
10.15 – 10.55 Session Chair Talk (invited)
  Daniel Müller
  ETH Zürich, Basel, Switzerland
  Multifunctional High-Resolution AFM of Native Proteins in Vivo and In Vitro
10.55 – 11.15 Invited Talk
  Bart Hoogenboom
  University College London, London, United Kingdom
  Probing and Modelling Unstructured Proteins in Intact Nuclear Pore Complexes
11.15 – 11.35 Invited Talk

Georg Fantner

  EPFL Lausanne, Switzerland
  Characterization of Temporal Processes at the Nanometer Scale using HS-AFM and Molecular Dynamics Simulation
11.35 – 11.55 Aysegul Cumurcu
  MESA+ ,University of Twente, Enschede, The Netherlands
  Nanoscale imaging of heterogeneous polymers by scanning near-field ellipsometry microscopy
11.55 – 12.15 Mathieu Surin
  University of Mons, Mons, Belgium
  Self-Assembly of p-conjugated Structures using DNA Templates: a joint SPM / molecular                         modelling study
Session 02 : Surface Structures and Properties by AFM
10.15 – 10.55 Session Chair Talk (invited)
  Gustavo Luengo
  L'OREAL, Aulnay-sous-Bois, France
  Influence of Polymers on Keratin Surface Properties in Cosmetics
10.55 – 11.15 Markus Hund
  Universität Bayreuth, Bayreuth, Germany
  Characterization of Core-Shell Particles using quasi in-situ Scanning Force Microscopy (QIS-SFM)
11.15 – 11.35 Yanyan Liu
  The University of New South Wales, Canberra, Australia.
  Micro-scratching of PET: Mechanisms of Debris Generation
11.35 – 11.55  Sayeda N. Nahar
  Delft University of Technology, Delft, The Netherlands
  Influence of Thermal Conditioning on Microstructures of Bituminous Materials
11.55 – 12.15 Daniel. W. Wesner
  Bielefeld University, Bielefeld, Germany
  The bio-nano-interface: Evaluating the Binding of Nanoparticles to Cellular Surfaces
12.15 – 14.00 Lunch
Session 03 : AFM on Biological and Biomimetic Systems II: Complex Assemblies
14.00 – 14.40 Session Chair Talk (invited)
  Pierre-Emmanuel Milhiet
  University of Montpellier, France
  Structure and Dynamics of Membrane Components using High-Speed AFM
14.40 – 15.00 David Alsteens
  Université Catholique de Louvain, Louvain-la-Neuve, Belgium
  Functional Amyloids Create Adhesion Nanodomains in Yeasts
15.00 – 15.20 Gilbert Nöll
  University of Siegen, Siegen, Germany
  One-and-More-Dimensional Protein-DNA-Nanostructures by Self-Assembly of Dodecin-Flavin-DNA-Complexes
15.20 – 15.40 Lorena Redondo-Morata
  Institute for Bioengineering of Catalonia (IBEC), Barcelona, Spain
  AFM Force-Clamp Monitors the Lipid Bilayer Failure Kinetics
15.40 – 16.00 Willem Vanderlinden
  Katholieke Universiteit Leuven, Heverlee, Belgium
  Mesoscale DNA Structural Changes on Binding and Photo-reaction with Ru[(TAP)2(PHEHAT)]2+
16.00 – 16.30 SPM Company Talk
  Ute Schmidt
  Witec GmbH, Ulm, Germany
  Analysis of Multi-Component Polymer Blends with the Confocal Raman AFM
Session 04 : Characterizing Polymeric Systems by AFM
14.00 – 14.40 Session Chair Talk (invited)
  Greg Meyers
  Dow Chemical, USA
  Predicting Contrast in Dynamic AFM of Polymeric Systems
14.40 – 15.00 David.W. Jr Abmayr
  ExxonMobil Chemical Co, Baytown, TX, USA
  Atomic Force Microscopy for the Advanced Characterization of Industrial Polymers
15.00 – 15.20 Astrid D. Drechsler
  Leibniz-Institut für Polymerforschung Dresden, Dresden, Germany
"In-situ SPM force measurements between silica spheres and polyelectrolyte brushes – tuning the interaction by variation of pH and salt concentration"
15.20 – 15.40 Stefano Piccarolo
  Università di Palermo, Palermo, Italy
  Polymer Solidification at High Cooling Rates: Source of Criticism of Standard Mechanisms of Crystallization
15.40 – 16.00 Mihaela Rusu
  DSM Resolve, Geleen, The Netherlands
  AFM Solutions in an Industrial Environment
16.00 – 16.30 SPM Company Talk
  Craig Prater
  Anasys Instruments, Santa Barbara, CA, USA
  Sub-100 nm Polymer Characterization via AFM based IR Spectroscopy and Thermo-mechanical Analysis (TMA)
 16.30 – 19.00 Poster Session
19.00 – 20.30 Dinner
Tuesday 25 September 2012
08.00 – 17.00 Registration
08.45 – 09.45 Keynote Lecture
  Ricardo Garcia
  CSIC, Madrid, Spain
  Quantitative and Molecular Resolution Imaging in Air and Liquid by Dynamic AFM Methods
09.45 – 10.15 Coffee Break
Session 05 : Soft Interfaces by Alternative or Combined Proximity Probe Microscopic Approaches
10.15 – 10.55 Session Chair Talk (invited)
  Atsushi Takahara
  Kyushu University, Fukuoka, Japan
  Direct Measurement of Thermal Behaviors of Polymer Interfaces and Polymer Nanorods                         by Nano-Thermal Analysis
10.55 – 11.15 Invited Talk
  Shan Zou
  National Research Council Canada, Ottawa, ON, Canada
  Correlated Imaging and Nanomechanical Force Mapping
11.15 – 11.35 Craig B. Prater
  Anasys Instruments, Santa Barbara, CA, USA
  Nanomechanical Spectroscopy using Lorentz Force Contact Resonance AFM with self-heating AFM Probes
11.35 – 11.55 Elke Ghijsens
  Katholieke Universiteit Leuven, Heverlee, Belgium
  Chiral Induction of Self-assembled Structures at the Liquid/Solid Interface: the Role of Solvent
11.55 – 12.15  Thomas S. van Zanten
  ICFO - Institut de Ciències Fotòniques, Castelldefels (Barcelona), Spain.
  Optical Nanoscopy of the Cell Membrane using Near-Field Scanning Optical Microscopy
Session 06 : Conductive AFM and STM
10.15 – 10.55 Session Chair Talk (invited)
  Rüdiger Berger
  Max Planck Institute for Polymer Research, Mainz, Germany
  A New Conductive Mode for Conductive Microscopy on Soft Samples
10.55 – 11.15 Benjamin Lachmann
  Christian-Albrechts-University, Kiel, Germany
  Electrical Conductivity of Single Molecules Measured with Conductive AFM
11.15 – 11.35 David Moerman
  University of Mons, Mons, Belgium

Identifying Charge Transport Mechanisms in the Conductive Atomic Force Microscopy Probing of Semiconducting Polymer Thin Films

11.35 – 11.55 Lorenz Walder
  Universität Osnabrück, Osnabrück, Germany
  Self Assembling of Poly- and Oligo-Viologens on CNTs as Evidenced by STM
11.55 – 12.15 Olivier Douhéret
  Materia Nova, Mons, Belgium
  Nanoscale Investigations of Photo-Electrical Mechanisms in Organic Solar Cells: The Key Role of Novel Scanning Probe Microscopies
12.15 – 14.00 Lunch
Session 07 : Advanced Force Spectroscopy
14.00 – 14.40 Session Chair Talk (invited)
  Sergei Sheiko
  University of North Carolina, NC, USA
  Molecular Mechanochemistry
14.40 – 15.00 Thomas Nick
  Johannes Gutenberg University, Mainz, Germany
  Rupture Force based of Split Aptamer Binding Tetracycline
15.00 – 15.20 Michael Pill
  Munich University of Applied Sciences, Munich, Germany
  Force Dependence of Mechanochemical Reactions determined with Single Molecule Force Spectroscopy and ab initio Simulation
15.20 – 15.40 Doreen Schütze
  Christian-Albrechts-University, Kiel, Germany
  Single Molecule Force-clam Spectroscopy on Azobenzene Monomers linking PEG Spacers
15.40 – 16.00 Seth L. Young
  Georgia Institute of Technology, Atlanta, GA, USA
  Utilizing Conformational Changes for Patterning Thin Films of Recombinant Spider Silk Proteins
16.00 – 16.30 SPM Company Talk
  Peter Dewolf
  Bruker Nano, Santa Barbara, CA, USA
  Eliminating the Limitations of Contact-Mode in AFM-based Electrical Characterization
Session 08 : Nanomechanical Analyses by AFM I : Polymers
14.00 – 14.40 Session Chair Talk (invited)
  Andy H. Tsou
  ExxonMobil Research & Engineering Co., Annandale, NJ, USA
  Nano-Mechanical Contrast and Characterization of Viscoelastic Polyolefins with Dynamic Atomic Force Microscopy
14.40 – 15.00 Invited talk
  Davide Tranchida
  Borealis Polyolefin GmbH, Linz, Austria
  Linking Mechanical Properties and Thermal Analysis of Polyolefins on Nanometer Scale
15.00 – 15.20 Amir Bahrami
  Université Catholique de Louvain, Louvain-la-Neuve, Belgium
  Quantitative Nanomechanical Property Mapping in Polymer Blends and Nanocomposites using Atomic Force Microscopy (AFM)
15.20 – 15.40 Daniel Forchheimer
  Royal Institute of Technology (KTH), Stockholm, Sweden
  Probing Viscous and Elastic Forces with Dynamic AFM on Polymer Surfaces
15.40 – 16.00 Jérôme Sarrazin

ExxonMobil Europe Inc., Machelen, Belgium

  Can we measure viscoelasticity with the help of PeakForce microscopy?
16.00 – 16.30 SPM Company Talk
  Roland Goschke
  Atomic Force, Mannheim, Germany
  AM-FM and Loss Tangent Imaging for Quantitative Nanomechanical Properties
16.30 – 19.00 Poster Session
19.00 – 21.00 Conference Dinner
Wednesday 26 September 2012  
08.00 – 12.00 Registration
08.45 – 09.45 Keynote Lecture
  Vladimir Tsukruk
  Georgia Institute of Technology, Atlanta, GA, USA
  Scanning Probe Microscopy of Soft Matter: View of an Experienced User
09.45 – 10.15 Coffee Break
Session 09 : Electrical Properties by AFM
10.15 – 10.55 Session Chair Talk (invited)
  David Ginger
  University of Washington, Seattle, WA, USA
  Probing Trap Formation in Polymer Solar Cells with Time Resolved Electrostatic Force Microscopy
10.55 – 11.15 Nasima Afshar Imani
  Université Catholique de Louvain, Louvain-la-Neuve, Belgium
  DOTT-Based Organic Thin-Film Transistors: A Kelvin Probe Force Microscopy Study of Electronic Properties
11.15 – 11.35 Ravi Chandra Chintala
  IMEC, Heverlee, Belgium
  Electrical Properties of APTMS SAM Layers studied with Conductive Atomic Force Microscope
11.35 – 11.55 Carsten Hentschel
  Westfälische Wilhelms-Universität Münster, Münster, Germany
  Electrical Characterization of Individual Polymer Nanowires Using Conductance Atomic Force Microscopy
11.55 – 12.15  Eleftherios Siamantouras
  University of Warwick, Coventry, United Kingdom
  Investigating Viscoelastic Effects on Cell Adhesion using Atomic Force Microscopy
Session 10 : Tip-Sample Forces and Analyses of Soft Interfaces
10.15 – 10.55 Session Chair Talk (invited)
  Frieder Mugele
  University of Twente, Enschede, The Netherlands
  High Resolution Surface-Charge Measurements at Solid-Electrolyte Interfaces using                            
Small Amplitude Frequency Modulation Dynamic Force Spectroscopy
10.55 – 11.15  Andrea Cerreta
  Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland
  Fine DNA Structure Revealed by Frequency Modulation AFM
11.15 – 11.35 Bede Pittenger
  Bruker-Nano, Santa Barbara, CA, USA

Mapping Tip-Sample Interactions at the Atomic Scale with Peak Force Tapping

11.35 – 11.55 Horacio A. Vargas Guzman
  Instituto de Microelectrónica de Madrid, Madrid, Spain
  Peak Forces in Dynamic Atomic Force Microscopy Imaging of Soft Matter in Liquid
11.55 – 12.15 Wiktoria Walczyk
  University of Siegen, Siegen, Germany
  The Effect of AFM Imaging Conditions on the Apparent Dimensions of Surface Nanobubbles
12.15 – 14.00 Lunch
Session 11 : Nanomechanical Analyses by AFM II : Biomaterials
14.00 – 14.40 Session Chair Talk (invited)
  Steven Jesse
  ORNL, Oak Ridge, TN, USA
  Sines of Change: The Band Excitation Method applied to Soft Materials
14.40 – 15.10 SPM Company Talk
  Erik A. Thoelen
  Intermodulation Products AB, Solna, Sweden
  Quantitative surface analysis with intermodulation AFM
15.10 – 15.40 SPM Company Talk
  Thomas Henze
  JPK Instruments AG, Berlin, Germany
  Advanced AFM Imaging Modes for High-Resolution and Quantitative Imaging
15.40 – 16.00 Martin Bennink
  University of Twente, Enschede, The Netherlands
  Nanomechanical Properties of alpha-Synuclein Fibrils providing Insight into the Structure of the Fibrils
16.00 – 16.20 Best Posters and Best Oral Communication Awards
16.20 – 16.30 Concluding Remarks