On September 2, SPM-on-spm 2014 will offer a one and half hours workshop; sponsored by BrukerNano.
Highest Resolution Nanochemical and Property Mapping with Bruker’s Inspire
In this workshop we introduce the new Bruker Inspire system, which leverages PeakForce Tapping™ and integrated scattering scanning near-field optical microscopy (sSNOM) optics to combine the best of AFM with nanoscale IR chemical mapping. Inspire and PeakForce Tapping extend AFM-level spatial resolution to nanomechanical and nanoelectrical mapping, even on soft polymeric materials. For the first time, chemical and quantitative nanomechanical maps are acquired concurrently, at highest spatial resolution. With IR optical mapping at 10nm lateral resolution and monolayer sensitivity, revealing chemistry, material type, and plasmonics, we will show how Inspire opens the door to a whole range of new nanoscale science.